AAAAAA

   
Results: 1-10 |
Results: 10
EDDY-CURRENT DECAY AND RESISTIVITY MEASUREMENTS ON LONGITUDINALLY GROOVED HIGH-PURITY ALUMINUM BARS
Authors: GILLENWATER MW HARTWIG KT HUA CY
Citation: Mw. Gillenwater et al., EDDY-CURRENT DECAY AND RESISTIVITY MEASUREMENTS ON LONGITUDINALLY GROOVED HIGH-PURITY ALUMINUM BARS, Journal of testing and evaluation, 26(4), 1998, pp. 320-328
MICROSTRUCTURE AND PROPERTIES OF COPPER AND ALUMINUM-ALLOY-3003 HEAVILY WORKED BY EQUAL CHANNEL ANGULAR EXTRUSION
Authors: FERRASSE S SEGAL VM HARTWIG KT GOFORTH RE
Citation: S. Ferrasse et al., MICROSTRUCTURE AND PROPERTIES OF COPPER AND ALUMINUM-ALLOY-3003 HEAVILY WORKED BY EQUAL CHANNEL ANGULAR EXTRUSION, Metallurgical and materials transactions. A, Physical metallurgy andmaterials science, 28(4), 1997, pp. 1047-1057
THE EQUAL CHANNEL ANGULAR EXTRUSION PROCESS FOR MATERIALS PROCESSING (VOL 37, PG 295, 1996)
Authors: CORNWELL LR HARTWIG KT GOFORTH RE SEMIATIN SL
Citation: Lr. Cornwell et al., THE EQUAL CHANNEL ANGULAR EXTRUSION PROCESS FOR MATERIALS PROCESSING (VOL 37, PG 295, 1996), Materials characterization, 38(2), 1997, pp. 119-119
IN-SITU COMPOSITES PROCESSED BY SIMPLE SHEAR
Authors: SEGAL VM HARTWIG KT GOFORTH RE
Citation: Vm. Segal et al., IN-SITU COMPOSITES PROCESSED BY SIMPLE SHEAR, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 224(1-2), 1997, pp. 107-115
DEVELOPMENT OF A SUBMICROMETER-GRAINED MICROSTRUCTURE IN ALUMINUM-6061 USING EQUAL CHANNEL ANGULAR EXTRUSION
Authors: FERRASSE S SEGAL VM HARTWIG KT GOFORTH RE
Citation: S. Ferrasse et al., DEVELOPMENT OF A SUBMICROMETER-GRAINED MICROSTRUCTURE IN ALUMINUM-6061 USING EQUAL CHANNEL ANGULAR EXTRUSION, Journal of materials research, 12(5), 1997, pp. 1253-1261
EDDY-CURRENT DECAY RESISTIVITY MEASUREMENTS USING A DIGITAL-VOLTMETER
Authors: HUA CY MCDONALD LC HARTWIG KT
Citation: Cy. Hua et al., EDDY-CURRENT DECAY RESISTIVITY MEASUREMENTS USING A DIGITAL-VOLTMETER, Journal of testing and evaluation, 25(1), 1997, pp. 41-48
MICRO-ALLOYED HIGH-PURITY ALUMINUM FOR LOW-TEMPERATURE CONDUCTOR APPLICATIONS
Authors: TAKAHASHI A MCDONALD LC YASUDA H HARTWIG KT
Citation: A. Takahashi et al., MICRO-ALLOYED HIGH-PURITY ALUMINUM FOR LOW-TEMPERATURE CONDUCTOR APPLICATIONS, Physica status solidi. a, Applied research, 160(2), 1997, pp. 413-418
THE EQUAL CHANNEL ANGULAR EXTRUSION PROCESS FOR MATERIALS PROCESSING
Authors: CORNWELL LR HARTWIG KT GOFORTH RE SEMIATIN SL
Citation: Lr. Cornwell et al., THE EQUAL CHANNEL ANGULAR EXTRUSION PROCESS FOR MATERIALS PROCESSING, Materials characterization, 37(5), 1996, pp. 295-300
RRR MEASUREMENTS ON A SMES-ETM MOCKUP SUPERCONDUCTOR
Authors: HARTWIG KT MCDONALD LC HARPER JD HUA CY
Citation: Kt. Hartwig et al., RRR MEASUREMENTS ON A SMES-ETM MOCKUP SUPERCONDUCTOR, IEEE transactions on applied superconductivity, 5(2), 1995, pp. 307-310
MICROALLOYED ALUMINUM FOR CRYOGENIC CONDUCTORS
Authors: MCDONALD LC HARTWIG KT TAKAHASHI A
Citation: Lc. Mcdonald et al., MICROALLOYED ALUMINUM FOR CRYOGENIC CONDUCTORS, JOM, 47(2), 1995, pp. 41-43
Risultati: 1-10 |