Citation: G. Gillen et al., QUANTITATIVE SECONDARY-ION MASS-SPECTROMETRY IMAGING OF SELF-ASSEMBLED MONOLAYER FILMS FOR ELECTRON-BEAM DOSE MAPPING IN THE ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPE, Scanning, 20(5), 1998, pp. 404-409
Citation: S. Wight et al., DEVELOPMENT OF ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPY ELECTRON-BEAM PROFILE IMAGING WITH SELF-ASSEMBLED MONOLAYERS AND SECONDARY-ION MASS-SPECTROSCOPY, Scanning, 19(2), 1997, pp. 71-74