Authors: LEE YH SHIN YD HERR PH LEE KH KIM HJ HAN SH KANG IK RHEE JR

Citation: Yh. Lee et al., DC BIASED CAPACITANCE METHOD FOR MEASURING THIN-FILM MAGNETOSTRICTIONAND DELTA-EPSILON-EFFECT, IEEE transactions on magnetics, 30(6), 1994, pp. 4566-4568