Authors: FEICK H FRETWURST E HEYDARPOOR P LINDSTROM G MOLL M

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Authors: FRETWURST E DEHN C FEICK H HEYDARPOOR P LINDSTROM G MOLL M SCHUTZE C SCHULZ T

Citation: E. Fretwurst et al., NEUTRON-INDUCED DEFECTS IN SILICON DETECTORS CHARACTERIZED BY DLTS AND TSC METHODS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 377(2-3), 1996, pp. 258-264