Authors: TROLIERMCKINSTRY S CHINDAUDOM P VEDAM K HIREMATH BV

Citation: S. Troliermckinstry et al., CHARACTERIZATION OF OPTICAL THIN-FILMS BY SPECTROSCOPIC ELLIPSOMETRY, Journal of the American Ceramic Society, 78(9), 1995, pp. 2412-2416

Authors: HIREMATH BV

Citation: Bv. Hiremath, EVALUATION OF TUMBLING PROCESSES OF MULTILAYER CERAMIC CAPACITORS FORSURFACE-MOUNT DEVICE APPLICATIONS, IEEE transactions on components, hybrids, and manufacturing technology, 16(8), 1993, pp. 822-827