Authors: METZGER T HOPLER R BORN E AMBACHER O STUTZMANN M STOMMER R SCHUSTER M GOBEL H CHRISTIANSEN S ALBRECHT M STRUNK HP

Citation: T. Metzger et al., DEFECT STRUCTURE OF EPITAXIAL GAN FILMS DETERMINED BY TRANSMISSION ELECTRON-MICROSCOPY AND TRIPLE-AXIS X-RAY-DIFFRACTOMETRY, Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties, 77(4), 1998, pp. 1013-1025

Authors: STUTZMANN M AMBACHER O CROS A BRANDT MS ANGERER H DIMITROV R REINACHER N METZGER T HOPLER R BRUNNER D FREUDENBERG F HANDSCHUH R DEGER C

Citation: M. Stutzmann et al., PROPERTIES AND APPLICATIONS OF MBE GROWN ALGAN, Materials science & engineering. B, Solid-state materials for advanced technology, 50(1-3), 1997, pp. 212-218

Authors: CROS A ANGERER H AMBACHER O STUTZMANN M HOPLER R METZGER T

Citation: A. Cros et al., RAMAN-STUDY OF THE OPTICAL PHONONS IN ALXGA1-XN ALLOYS, Solid state communications, 104(1), 1997, pp. 35-39

Authors: METZGER T HOPLER R BORN E CHRISTIANSEN S ALBRECHT M STRUNK HP AMBACHER O STUTZMANN M STOMMER R SCHUSTER M GOBEL H

Citation: T. Metzger et al., COHERENT X-RAY-SCATTERING PHENOMENON IN HIGHLY DISORDERED EPITAXIAL ALN FILMS, Physica status solidi. a, Applied research, 162(2), 1997, pp. 529-535

Authors: BRUNNER D ANGERER H BUSTARRET E FREUDENBERG F HOPLER R DIMITROV R AMBACHER O STUTZMANN M

Citation: D. Brunner et al., OPTICAL-CONSTANTS OF EPITAXIAL ALGAN FILMS AND THEIR TEMPERATURE-DEPENDENCE, Journal of applied physics, 82(10), 1997, pp. 5090-5096

Authors: ANGERER H BRUNNER D FREUDENBERG F AMBACHER O STUTZMANN M HOPLER R METZGER T BORN E DOLLINGER G BERGMAIER A KARSCH S KORNER HJ

Citation: H. Angerer et al., DETERMINATION OF THE AL MOLE FRACTION AND THE BAND-GAP BOWING OF EPITAXIAL ALXGA1-XN FILMS, Applied physics letters, 71(11), 1997, pp. 1504-1506