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Citation: Y. Gauthier et al., SURFACE ALLOY IN THE C(4X4) PHASE OF PB ON CU(100), Surface science, 345(1-2), 1996, pp. 53-63

Authors: HOSLER W DARJI R

Citation: W. Hosler et R. Darji, ON THE NONLINEARITY OF SILICON DETECTORS AND THE ENERGY CALIBRATION IN RBS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 602-606

Authors: SCHEITHAUER U HOSLER W BRUCHHAUS R

Citation: U. Scheithauer et al., COMBINED AES FACTOR ANALYSIS AND RBS INVESTIGATION OF A THERMALLY TREATED PT/TI METALLIZATION ON SIO2/, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 305-307

Authors: HOSLER W PAMLER W

Citation: W. Hosler et W. Pamler, EFFECTS OF CRYSTALLINITY ON DEPTH RESOLUTION IN SPUTTER DEPTH PROFILES, Surface and interface analysis, 20(8), 1993, pp. 609-620

Authors: SCHEITHAUER U HOSLER W RIEDL G

Citation: U. Scheithauer et al., EVALUATION OF AES DEPTH PROFILES OF THIN-FILM SYSTEMS BY APPLICATION OF NOVEL GRAPHICALLY INTERACTIVE FACTOR-ANALYSIS SOFTWARE, Surface and interface analysis, 20(6), 1993, pp. 519-523