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Results:
1-8
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Results: 8
Authors:
AZZAM RMA
HOWLADER MMK
Citation: Rma. Azzam et Mmk. Howlader, SILICON-BASED POLARIZATION OPTICS FOR THE 1.30 AND 1.55 MU-M COMMUNICATION WAVELENGTHS, Journal of lightwave technology, 14(5), 1996, pp. 873-878
Authors:
RIZA NA
HOWLADER MMK
MADAMOPOULOS N
Citation: Na. Riza et al., PHOTONIC SECURITY SYSTEM USING SPATIAL CODES AND REMOTE CODED COHERENT OPTICAL COMMUNICATIONS, Optical engineering, 35(9), 1996, pp. 2487-2498
Authors:
RIZA NA
HOWLADER MMK
Citation: Na. Riza et Mmk. Howlader, ACOUSTOOPTIC SYSTEM FOR THE GENERATION AND CONTROL OF TUNABLE LOW-FREQUENCY SIGNALS, Optical engineering, 35(4), 1996, pp. 920-925
Authors:
AZZAM RMA
HOWLADER MMK
Citation: Rma. Azzam et Mmk. Howlader, BILAYER COATINGS THAT PRODUCE A 90-DEGREES DIFFERENTIAL REFLECTION PHASE-SHIFT AT OBLIQUE-INCIDENCE - ALL POSSIBLE SOLUTIONS, Thin solid films, 272(1), 1996, pp. 143-147
Authors:
AZZAM RMA
HOWLADER MMK
GEORGIOU TY
Citation: Rma. Azzam et al., SINGLE-LAYER-COATED SURFACES WITH LINEARIZED REFLECTANCE VERSUS ANGLEOF INCIDENCE - APPLICATION TO PASSIVE AND ACTIVE SILICON ROTATION SENSORS, Journal of the Optical Society of America. A, Optics, image science,and vision., 12(8), 1995, pp. 1790-1796
Authors:
HOWLADER MMK
AZZAM RMA
Citation: Mmk. Howlader et Rma. Azzam, PERIODIC AND QUASI-PERIODIC NONQUARTERWAVE MULTILAYER COATINGS FOR 90-DEG REFLECTION PHASE RETARDATION AT 45-DEG ANGLE OF INCIDENCE, Optical engineering, 34(3), 1995, pp. 869-875
Authors:
AZZAM RMA
HOWLADER MMK
Citation: Rma. Azzam et Mmk. Howlader, REAL-TIME ADSORPTION-DESORPTION THIN-FILM OPTICAL MONITOR USING A WINDOWLESS REFLECTIVE SILICON PHOTODETECTOR, Review of scientific instruments, 66(8), 1995, pp. 4362-4366
Authors:
AZZAM RMA
HOWLADER MMK
Citation: Rma. Azzam et Mmk. Howlader, MEASUREMENT OF THE THICKNESS OF DIELECTRIC THIN-FILMS ON SILICON PHOTODETECTORS USING THE ANGULAR RESPONSE TO INCIDENT LINEARLY POLARIZED-LIGHT, IEEE transactions on instrumentation and measurement, 43(6), 1994, pp. 799-802
Risultati:
1-8
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