Authors: HUDLET S SAINTJEAN M GUTHMANN C BERGER J

Citation: S. Hudlet et al., EVALUATION OF THE CAPACITIVE FORCE BETWEEN AN ATOMIC-FORCE MICROSCOPYTIP AND A METALLIC SURFACE, EUROPEAN PHYSICAL JOURNAL B, 2(1), 1998, pp. 5-10

Authors: SAINTJEAN M HUDLET S GUTHMANN C BERGER J

Citation: M. Saintjean et al., CHARGE DYNAMICS AND TIME EVOLUTION OF CONTACT POTENTIAL STUDIED BY ATOMIC-FORCE MICROSCOPY, Physical review. B, Condensed matter, 56(23), 1997, pp. 15391-15395

Authors: HUDLET S SAINTJEAN M ROYER D BERGER J GUTHMANN C

Citation: S. Hudlet et al., IN SITE MEASUREMENT OF LARGE PIEZOELECTRIC DISPLACEMENTS IN RESONANT ATOMIC-FORCE MICROSCOPY, Review of scientific instruments, 66(4), 1995, pp. 2848-2852

Authors: HUDLET S SAINTJEAN M ROULET B BERGER J GUTHMANN C

Citation: S. Hudlet et al., ELECTROSTATIC FORCES BETWEEN METALLIC TIP AND SEMICONDUCTOR SURFACES, Journal of applied physics, 77(7), 1995, pp. 3308-3314

Authors: HUDLET S SAINTJEAN M ROULET B BERGER J GUTHMANN C

Citation: S. Hudlet et al., ELECTROSTATIC FORCES BETWEEN A METALLIC TIP AND SEMICONDUCTOR SURFACES, Journal de physique. I, 4(11), 1994, pp. 1725-1742

Authors: HUDLET S JEAN MS ROULET B BERGER J GUTHMANN C

Citation: S. Hudlet et al., ELECTROSTATIC FORCES BETWEEN A METALLIC TIP AND SEMICONDUCTOR SURFACES, Microscopy microanalysis microstructures, 5(4-6), 1994, pp. 467-476