Authors:
Haeberle, O
Xu, C
Dieterlen, A
Jacquey, S
Citation: O. Haeberle et al., Multiple-objective microscopy with three-dimensional resolution near 100 nm and a long working distance, OPTICS LETT, 26(21), 2001, pp. 1684-1686
Authors:
Haeberle, O
Bicha, F
Simler, C
Dieterlen, A
Xu, C
Colicchio, B
Jacquey, S
Gramain, MP
Citation: O. Haeberle et al., Identification of acquisition parameters from the point spread function ofa fluorescence microscope, OPT COMMUN, 196(1-6), 2001, pp. 109-117
Citation: Y. Takakura et O. Haeberle, Integral method to study transition radiation from surfaces with arbitraryprofile, PHYS REV E, 61(4), 2000, pp. 4441-4444