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Hagimoto, Y
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Authors:
Oh, JH
Yeom, HW
Hagimoto, Y
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Hirashita, N
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Citation: Jh. Oh et al., Chemical structure of the ultrathin SiO2/Si(100) interface: An angle-resolved Si 2p photoemission study - art. no. 205310, PHYS REV B, 6320(20), 2001, pp. 5310
Authors:
Matsugi, M
Itoh, K
Nojima, M
Hagimoto, Y
Kita, Y
Citation: M. Matsugi et al., A novel determination method of the absolute configuration of 1-aryl-1-alkylalcohols and amines by an intramolecular CH/pi shielding effect in H-1 NMR, TETRAHEDR L, 42(45), 2001, pp. 8019-8022
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Authors:
Matsugi, M
Itoh, K
Nojima, M
Hagimoto, Y
Kita, Y
Citation: M. Matsugi et al., Determination of absolute configuration of trans-2-arylcyclohexanols usingremarkable aryl-induced H-1 NMR shifts in diastereomeric derivatives, TETRAHEDR L, 42(39), 2001, pp. 6903-6905
Authors:
Hagimoto, Y
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Citation: Y. Hagimoto et al., Characterizing carrier-trapping phenomena in ultrathin SiO2 films by usingthe x-ray photoelectron spectroscopy time-dependent measurements, APPL PHYS L, 77(25), 2000, pp. 4175-4177
Authors:
Hagimoto, Y
Fujita, T
Ono, K
Fujioka, H
Oshima, M
Hirose, K
Tajima, M
Citation: Y. Hagimoto et al., Characterization of carrier-trapping phenomena in ultrathin chemical oxides using x-ray photoelectron spectroscopy time-dependent measurements, APPL PHYS L, 74(14), 1999, pp. 2011-2013