Authors: Halder, NC Zhao, X

Citation: Nc. Halder et X. Zhao, More exact method of determination of the trap concentration of deep levels: Application to molecular beam epitaxy-grown, low temperature GaAs, J VAC SCI B, 17(5), 1999, pp. 2019-2024

Authors: Halder, NC Goodman, T

Citation: Nc. Halder et T. Goodman, Deep levels in low temperature GaAs probed by field effect deep level transient spectroscopy, J VAC SCI B, 17(1), 1999, pp. 60-67