AAAAAA
Results:
1-3
|
Results: 3
Authors:
Lee, CH
Hall, DV
Perkowski, MA
Jun, DS
Citation: Ch. Lee et al., Self-repairable GALs, J SYST ARCH, 47(2), 2001, pp. 119-135
"A minimal universal test set for self-test of EXOR-Sum-of-Products circuits" (vol 49, pg 267, 2000)
Authors:
Kalay, U
Perkowski, MA
Hall, DV
Citation: U. Kalay et al., "A minimal universal test set for self-test of EXOR-Sum-of-Products circuits" (vol 49, pg 267, 2000), IEEE COMPUT, 49(5), 2000, pp. 525-525
Authors:
Kalay, U
Hall, DV
Perkowski, MA
Citation: U. Kalay et al., A minimal universal test set for self-test of EXOR-Sum-of-Products circuits, IEEE COMPUT, 49(3), 2000, pp. 267-276
Risultati:
1-3
|