Authors:
Kemmer, J
Hauff, D
Krause, N
Krieglmeyer, C
Yang, YX
Citation: J. Kemmer et al., Current and capacitance measurements as a fast diagnostic tool for evaluation of semiconductor parameters, NUCL INST A, 439(2-3), 2000, pp. 199-207
Authors:
Krause, N
Soltau, H
Hauff, D
Kemmer, J
Stotter, D
Struder, L
Weber, J
Citation: N. Krause et al., Metal contamination analysis of the epitaxial starting material for scientific CCDs, NUCL INST A, 439(2-3), 2000, pp. 228-238
Authors:
Andricek, L
Hauff, D
Kemmer, J
Koffeman, E
Lukewille, P
Lutz, G
Moser, HG
Richter, RH
Rohe, T
Soltau, H
Viehl, A
Citation: L. Andricek et al., Design and test of radiation hard p(+)n silicon strip detectors for the ATLAS SCT, NUCL INST A, 439(2-3), 2000, pp. 427-441
Authors:
Soltau, H
Kemmer, J
Meidinger, N
Stotter, D
Struder, L
Trumper, J
von Zanthier, C
Brauniger, H
Briel, U
Carathanassis, D
Dennerl, K
Engelhard, S
Haberl, F
Hartmann, R
Hartner, G
Hauff, D
Hippmann, H
Holl, P
Kendziorra, E
Krause, N
Lechner, P
Pfeffermann, E
Popp, M
Reppin, C
Seitz, H
Solc, P
Stadlbauer, T
Weber, U
Weichert, U
Citation: H. Soltau et al., Fabrication, test and performance of very large X-ray CCDs designed for astrophysical applications, NUCL INST A, 439(2-3), 2000, pp. 547-559