Authors: Kemmer, J Hauff, D Krause, N Krieglmeyer, C Yang, YX

Citation: J. Kemmer et al., Current and capacitance measurements as a fast diagnostic tool for evaluation of semiconductor parameters, NUCL INST A, 439(2-3), 2000, pp. 199-207

Authors: Krause, N Soltau, H Hauff, D Kemmer, J Stotter, D Struder, L Weber, J

Citation: N. Krause et al., Metal contamination analysis of the epitaxial starting material for scientific CCDs, NUCL INST A, 439(2-3), 2000, pp. 228-238

Authors: Andricek, L Hauff, D Kemmer, J Koffeman, E Lukewille, P Lutz, G Moser, HG Richter, RH Rohe, T Soltau, H Viehl, A

Citation: L. Andricek et al., Design and test of radiation hard p(+)n silicon strip detectors for the ATLAS SCT, NUCL INST A, 439(2-3), 2000, pp. 427-441

Authors: Soltau, H Kemmer, J Meidinger, N Stotter, D Struder, L Trumper, J von Zanthier, C Brauniger, H Briel, U Carathanassis, D Dennerl, K Engelhard, S Haberl, F Hartmann, R Hartner, G Hauff, D Hippmann, H Holl, P Kendziorra, E Krause, N Lechner, P Pfeffermann, E Popp, M Reppin, C Seitz, H Solc, P Stadlbauer, T Weber, U Weichert, U

Citation: H. Soltau et al., Fabrication, test and performance of very large X-ray CCDs designed for astrophysical applications, NUCL INST A, 439(2-3), 2000, pp. 547-559

Authors: Andricek, L Hauff, D Kemmer, J Lukewille, P Lutz, G Moser, HG Richter, RH Rohe, T Stolze, K Viehl, A

Citation: L. Andricek et al., Radiation hard strip detectors for large-scale silicon trackers, NUCL INST A, 436(1-2), 1999, pp. 262-271