Authors:
Patnaik, S
Cooley, LD
Gurevich, A
Polyanskii, AA
Jing, J
Cai, XY
Squitieri, AA
Naus, MT
Lee, MK
Choi, JH
Belenky, L
Bu, SD
Letteri, J
Song, X
Schlom, DG
Babcock, SE
Eom, CB
Hellstrom, EE
Larbalestier, DC
Citation: S. Patnaik et al., Electronic anisotropy, magnetic field-temperature phase diagram and their dependence on resistivity in c-axis oriented MgB2 thin films, SUPERCOND S, 14(6), 2001, pp. 315-319
Citation: Mo. Rikel et Ee. Hellstrom, Development of 2201 intergrowths during melt processing Bi2212/Ag conductors, PHYSICA C, 357, 2001, pp. 1081-1090
Authors:
Rikel, MO
Wesolowski, D
Yuan, Y
Hellstrom, EE
Citation: Mo. Rikel et al., Competitiveness of porosity and phase purity in melt processed Bi2212/Ag conductors, PHYSICA C, 354(1-4), 2001, pp. 321-326
Citation: Of. De Lima et Ee. Hellstrom, Proceedings of the International Cryogenic Materials Conference ICMC 2000 - Superconductors for Applications, Materials Properties and Devices - Rio de Janeiro, Brazil, June 11-15, 2000 - Preface, PHYSICA C, 354(1-4), 2001, pp. VII-VII
Authors:
Eom, CB
Lee, MK
Choi, JH
Belenky, LJ
Song, X
Cooley, LD
Naus, MT
Patnaik, S
Jiang, J
Rikel, M
Polyanskii, A
Gurevich, A
Cai, XY
Bu, SD
Babcock, SE
Hellstrom, EE
Larbalestier, DC
Rogado, N
Regan, KA
Hayward, MA
He, T
Slusky, JS
Inumaru, K
Haas, MK
Cava, RJ
Citation: Cb. Eom et al., High critical current density and enhanced irreversibility field in superconducting MgB2 thin films, NATURE, 411(6837), 2001, pp. 558-560
Authors:
Larbalestier, DC
Cooley, LD
Rikel, MO
Polyanskii, AA
Jiang, J
Patnaik, S
Cai, XY
Feldmann, DM
Gurevich, A
Squitieri, AA
Naus, MT
Eom, CB
Hellstrom, EE
Cava, RJ
Regan, KA
Rogado, N
Hayward, MA
He, T
Slusky, JS
Khalifah, P
Inumaru, K
Haas, M
Citation: Dc. Larbalestier et al., Strongly linked current flow in polycrystalline forms of the superconductor MgB2, NATURE, 410(6825), 2001, pp. 186-189
Authors:
Reeves, JL
Hellstrom, EE
Irizarry, V
Lehndorff, B
Citation: Jl. Reeves et al., Effects of overpressure processing on porosity in Ag-sheathed Bi-2212 multifilamentary tapes with various geometries, IEEE APPL S, 9(2), 1999, pp. 1836-1839