Authors: Hellweg, S

Citation: S. Hellweg, Time- and site-dependent life cycle assessment of thermal waste treatment processes, INT J LIFE, 6(1), 2001, pp. 46-46

Authors: Brox, O Iltgen, K Hellweg, S Benninghoven, A

Citation: O. Brox et al., Determination of silicon oxide layer thickness by time-of-flight secondaryion mass spectroscopy, J VAC SCI B, 17(5), 1999, pp. 2191-2192