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Results: 1-11 |
Results: 11

Authors: Powell, JL Connor, GP Henderson, GS
Citation: Jl. Powell et al., Management of recurrent juvenile granulosa cell tumor of the ovary, GYNECOL ONC, 81(1), 2001, pp. 113-116

Authors: Powell, JL Connor, GP Henderson, GS
Citation: Jl. Powell et al., Androgen-producing, atypically proliferating endometrioid tumor arising inendometriosis, SOUTH MED J, 94(4), 2001, pp. 450-453

Authors: Sokolov, I Smith, DS Henderson, GS Gorby, YA Ferris, FG
Citation: I. Sokolov et al., Cell surface electrochemical heterogeneity of the Fe(III)-reducing bacteria Shewanella putrefaciens, ENV SCI TEC, 35(2), 2001, pp. 341-347

Authors: Sokolov, IY Henderson, GS
Citation: Iy. Sokolov et Gs. Henderson, Atomic resolution imaging using the electric double layer technique: friction vs. height contrast mechanisms, APPL SURF S, 157(4), 2000, pp. 302-307

Authors: Sokolov, IY Henderson, GS
Citation: Iy. Sokolov et Gs. Henderson, The height dependence of image contrast when imaging by non-contact AFM, SURF SCI, 464(2-3), 2000, pp. L745-L751

Authors: Sokolov, IY Henderson, GS Wicks, FJ
Citation: Iy. Sokolov et al., Model dependence of AFM simulations in non-contact mode, SURF SCI, 457(1-2), 2000, pp. 267-272

Authors: Sokolov, IY Henderson, GS Wicks, FJ
Citation: Iy. Sokolov et al., Force spectroscopy in noncontact mode, APPL SURF S, 140(3-4), 1999, pp. 358-361

Authors: Sokolov, IY Henderson, GS Wicks, FJ
Citation: Iy. Sokolov et al., Pseudo-non-contact AFM imaging?, APPL SURF S, 140(3-4), 1999, pp. 362-365

Authors: Sokolov, IY Henderson, GS Wicks, FJ
Citation: Iy. Sokolov et al., Imitation of non-contact mode while scanning in the presence of an electric double layer?, APPL SURF S, 140(3-4), 1999, pp. 422-427

Authors: Sokolov, IY Henderson, GS Wicks, FJ
Citation: Iy. Sokolov et al., Theoretical and experimental evidence for "true" atomic resolution under non-vacuum conditions, J APPL PHYS, 86(10), 1999, pp. 5537-5540

Authors: Wicks, FJ Henderson, GS Hawthorne, FC Kjoller, K
Citation: Fj. Wicks et al., Evidence for atomic-scale resolution in atomic-force microscopy of layer silicates, CAN MINERAL, 36, 1998, pp. 1607-1614
Risultati: 1-11 |