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Results: 1
MOS transistor reliability under analog operation
Authors:
Thewes, R Brederlow, R Schlunder, C Wieczorek, P Ankele, B Hesener, A Holz, J Kessel, S Weber, W
Citation:
R. Thewes et al., MOS transistor reliability under analog operation, MICROEL REL, 40(8-10), 2000, pp. 1545-1554
Risultati:
1-1
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