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Results: 1-9 |
Results: 9

Authors: Holgado, JP Morales, J Caballero, A Gonzalez-Elipe, AR
Citation: Jp. Holgado et al., Plate reactor for testing catalysts in the form of thin films, APP CATAL B, 31(3), 2001, pp. L5-L10

Authors: Barranco, A Holgado, JP Yubero, F Espinos, JP Martin, A Gonzalez-Elipe, AR
Citation: A. Barranco et al., Near edge x-ray absorption fine structure spectroscopy study of atomic nitrogen implanted in Al2O3 by low energy N-2(+) bombardment, J VAC SCI A, 19(3), 2001, pp. 1024-1026

Authors: Holgado, JP Espinos, JP Yubero, F Justo, A Ocana, M Benitez, J Gonzalez-Elipe, AR
Citation: Jp. Holgado et al., Ar stabilisation of the cubic/tetragonal phases of ZrO2 in thin films prepared by ion beam induced chemical vapour deposition, THIN SOL FI, 389(1-2), 2001, pp. 34-42

Authors: Holgado, JP Barranco, A Yubero, F Espinos, JP Gonzalez-Elipe, AR
Citation: Jp. Holgado et al., Surface microstructure of MgO deposited on SiO2 by analysis of plasmon excitations in photoemission experiments, SURF SCI, 482, 2001, pp. 1325-1330

Authors: Hernan, L Morales, J Sanchez, L Santos, J Espinos, JP Gonzalez-Elipe, AR Holgado, JP
Citation: L. Hernan et al., Study of in situ adsorption and intercalation of cobaltocene into SnS2 single crystals by photoelectron spectroscopy, SURF SCI, 477(2-3), 2001, pp. L295-L300

Authors: Gonzalez-Elipe, AR Yubero, F Espinos, JP Caballero, A Ocana, M Holgado, JP Morales, J
Citation: Ar. Gonzalez-elipe et al., Amorphisation and related structural effects in thin films prepared by ionbeam assisted methods, SURF COAT, 125(1-3), 2000, pp. 116-123

Authors: Holgado, JP Alvarez, R Munuera, G
Citation: Jp. Holgado et al., Study of CeO2 XPS spectra by factor analysis: reduction of CeO2, APPL SURF S, 161(3-4), 2000, pp. 301-315

Authors: Holgado, JP Munuera, G Espinos, JP Gonzalez-Elipe, AR
Citation: Jp. Holgado et al., XPS study of oxidation processes of CeOx defective layers, APPL SURF S, 158(1-2), 2000, pp. 164-171

Authors: Holgado, JP Caballero, A Espinos, JP Morales, J Jimenez, VM Justo, A Gonzalez-Elipe, AR
Citation: Jp. Holgado et al., Characterisation by X-ray absorption spectroscopy of oxide thin films prepared by ion beam-induced CVD, THIN SOL FI, 377, 2000, pp. 460-466
Risultati: 1-9 |