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Authors: Wieland, M Hanggi, P Hotz, W Textor, M Keller, BA Spencer, ND
Citation: M. Wieland et al., Wavelength-dependent measurement and evaluation of surface topographies: application of a new concept of window roughness and surface transfer function, WEAR, 237(2), 2000, pp. 231-252

Authors: Wieland, M Hanggi, P Hotz, W Textor, M Keller, BA Spencer, ND
Citation: M. Wieland et al., Wavelength-dependent measurement and evaluation of surface topographies: application of a new concept of window roughness and surface transfer function, WEAR, 237(2), 2000, pp. 231-252
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