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Results:
1-9
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Results: 9
Authors:
Guessab, S
Boyer, L
Houze, F
Noel, S
Schneegans, O
Citation: S. Guessab et al., Influence of temperature and pressure on the static contact resistance of vacuum heat-treated polyacrylonitrile films, SYNTH METAL, 118(1-3), 2001, pp. 121-132
Authors:
Kleider, JP
Longeaud, C
Bruggemann, R
Houze, F
Citation: Jp. Kleider et al., Electronic and topographic properties of amorphous and microcrystalline silicon thin films, THIN SOL FI, 383(1-2), 2001, pp. 57-60
Authors:
Pud, AA
Tabellout, M
Kassiba, A
Korzhenko, AA
Rogalsky, SP
Shapoval, GS
Houze, F
Schneegans, O
Emery, JR
Citation: Aa. Pud et al., The poly(ethylene terephthalate)/polyaniline composite: AFM, DRS and EPR investigations of some doping effects, J MATER SCI, 36(14), 2001, pp. 3355-3363
Authors:
Ravier, J
Houze, F
Carmona, F
Schneegans, O
Saadaoui, H
Citation: J. Ravier et al., Mesostructure of polymer/carbon black composites observed by conductive probe atomic force microscopy, CARBON, 39(2), 2001, pp. 314-318
Authors:
Planes, J
Houze, F
Chretien, P
Schneegans, O
Citation: J. Planes et al., Conducting probe atomic force microscopy applied to organic conducting blends, APPL PHYS L, 79(18), 2001, pp. 2993-2995
Authors:
Schneegans, O
Moradpour, A
Houze, F
Angelova, A
de Villeneuve, CH
Allongue, P
Chretien, P
Citation: O. Schneegans et al., Conducting probe-mediated electrochemical nanopatterning of molecular materials, J AM CHEM S, 123(46), 2001, pp. 11486-11487
Authors:
Degardin, AF
Schneegans, O
Houze, F
Caristan, E
De Luca, A
Chretien, P
Boyer, L
Kreisler, AJ
Citation: Af. Degardin et al., Atomic force microscopy with a conducting tip: correlation studies betweenmicrostructure and electrical properties of YBaCuO thin films, PHYSICA C, 341, 2000, pp. 1965-1968
First AFM observation of thin cermet films close to the percolation threshold using a conducting tip
Authors:
Gadenne, M
Schneegans, O
Houze, F
Chretien, P
Desmarest, C
Sztern, J
Gadenne, P
Citation: M. Gadenne et al., First AFM observation of thin cermet films close to the percolation threshold using a conducting tip, PHYSICA B, 279(1-3), 2000, pp. 94-97
Authors:
Noel, S
Houze, F
Boyer, L
Mekhalif, Z
Delhalle, J
Caudano, R
Citation: S. Noel et al., Self-assembled monolayers of alkanethiols on nickel surfaces for low levelelectrical contact applications, IEEE T COMP, 22(1), 1999, pp. 79-84
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