Authors:
Moore, KT
Stach, EA
Howe, JM
Elbert, DC
Veblen, DR
Citation: Kt. Moore et al., A tilting procedure to enhance compositional contrast and reduce residual diffraction contrast in energy-filtered TEM imaging of planar interfaces, MICRON, 33(1), 2002, pp. 39-51
Citation: Kt. Moore et Jm. Howe, Characterization of gamma plate-shaped precipitates in an Al-4.2 at.% Ag alloy - Growth kinetics, solute field, composition and modeling, ACT MATER, 48(16), 2000, pp. 4083-4098
Citation: Sq. Xiao et Jm. Howe, Analysis of a two-dimensional invariant line interface for the case of a general transformation strain and application to thin-film interfaces, ACT MATER, 48(12), 2000, pp. 3253-3260
Authors:
Nie, JF
Howe, JM
Vasudevan, VK
Aaronson, HI
Citation: Jf. Nie et al., Discussion of "Surface relief and the displacive transformation to the lamellar microstructure in TiAl" and "nanometer-scale, fully lamellar microstructure in an ages TiAl-based alloy", MET MAT T A, 31(9), 2000, pp. 2377-2379
Citation: Jm. Howe et G. Spanos, Atomic structure of the austenite-cementite interface of proeutectoid cementite plates, PHIL MAG A, 79(1), 1999, pp. 9-30
Citation: Kt. Moore et al., Analysis of diffraction contrast as a function of energy loss in energy-filtered transmission electron microscope imaging, ULTRAMICROS, 80(3), 1999, pp. 203-219
Authors:
Moore, KT
Howe, JM
Veblen, DR
Murray, TM
Stach, EA
Citation: Kt. Moore et al., Analysis of electron intensity as a function of aperture size in energy-filtered transmission electron microscope imaging, ULTRAMICROS, 80(3), 1999, pp. 221-236
Citation: Dm. Longo et al., Development of a focused ion beam (FIB) technique to minimize X-ray fluorescence during energy dispersive X-ray spectroscopy (EDS) of FIB specimens in the transmission electron microscope (TEM), ULTRAMICROS, 80(2), 1999, pp. 69-84
Citation: Dm. Longo et al., Experimental method for determining Cliff-Lorimer factors in transmission electron microscopy (TEM) utilizing stepped wedge-shaped specimens preparedby focused ion beam (FIB) thinning, ULTRAMICROS, 80(2), 1999, pp. 85-97
Citation: Kt. Moore et al., Scanning and transmission electron microscope investigation of preferential thinning during ion beam milling of an Al-Ag alloy containing gamma precipitate plates and the subsequent effects on microanalysis, ULTRAMICROS, 76(4), 1999, pp. 195-202