Authors:
Rossmanith, E
Hupe, A
Kurtz, R
Schmidt, H
Krane, HG
Citation: E. Rossmanith et al., Kinematical two-dimensional multiple-diffraction intensity profiles. Application to omega-psi scans of silicon and diamond obtained with synchrotron radiation, J APPL CRYS, 34, 2001, pp. 157-165