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Authors:
Yoon, YS
Baek, KH
Park, JM
Kwon, KH
Kim, CI
Hwang, IG
Citation: Ys. Yoon et al., Angle-resolved XPS investigation of the fluorine-related passivation layeron etched Al (Cu 1%) surface after SF6 treatment, J KOR PHYS, 34, 1999, pp. S305-S309