Authors:
Igeta, M
Banerjee, K
Wu, GH
Hu, CM
Majumdar, A
Citation: M. Igeta et al., Thermal characteristics of submicron vias studied by scanning Joule expansion microscopy, IEEE ELEC D, 21(5), 2000, pp. 224-226
Authors:
Takai, Y
Fujita, M
Nagata, K
Isa, S
Nakazawa, S
Hirobe, A
Ohkubo, H
Sakao, M
Horiba, S
Fukase, T
Takaishi, Y
Matsuo, M
Komuro, M
Uchida, T
Sakoh, T
Saino, K
Uchiyama, S
Takada, Y
Sekine, J
Nakanishi, N
Oikawa, T
Igeta, M
Tanabe, H
Miyamoto, H
Hashimoto, T
Yamaguchi, H
Koyama, K
Kobayashi, Y
Okuda, T
Citation: Y. Takai et al., A 250-Mb/s/pin, 1-Gb double-data-rate SDRAM with a bidirectional delay andan interbank shared redundancy scheme, IEEE J SOLI, 35(2), 2000, pp. 149-162
Citation: M. Igeta et al., Thermal expansion and temperature measurement in a microscopic scale by using the Atomic Force Microscope, JSME I J B, 42(4), 1999, pp. 723-730