Authors:
Cai, ZH
Rodrigues, W
Ilinski, P
Legnini, D
Lai, B
Yun, W
Isaacs, ED
Lutterodt, KE
Grenko, J
Glew, R
Sputz, S
Vandenberg, J
People, R
Alam, MA
Hybertsen, M
Ketelsen, LJP
Citation: Zh. Cai et al., Synchrotron x-ray microdiffraction diagnostics of multilayer optoelectronic devices, APPL PHYS L, 75(1), 1999, pp. 100-102