Authors: Anderson, WT Roussos, JA Mittereder, JA Ioannou, DE Moglestue, C

Citation: Wt. Anderson et al., Pseudomorphic high electron mobility transistor monolithic microwave integrated circuits reliability study, MICROEL REL, 41(8), 2001, pp. 1109-1113

Authors: Zhao, XJ Ioannou, DE

Citation: Xj. Zhao et De. Ioannou, "Gated-diode" in SOI MOSFETs: A sensitive tool for characterizing the buried Si/SiO2 interface, IEEE DEVICE, 48(4), 2001, pp. 685-687