Authors: DUNHAM ST COLLINS N JENG N

Citation: St. Dunham et al., IMPROVED ANALYSIS OF SPREADING RESISTANCE MEASUREMENTS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(1), 1994, pp. 283-289

Authors: BATRA S JENG N SULTAN A PICONE K BHATTACHARYA S PARK KH BANERJEE S KAO D MANNING M DENNISON C

Citation: S. Batra et al., EFFECT OF EPITAXIAL REALIGNMENT ON THE LEAKAGE BEHAVIOR OF ARSENIC-IMPLANTED, AS-DEPOSITED POLYCRYSTALLINE SI-ON-SINGLE CRYSTAL SI DIODES, Journal of electronic materials, 22(5), 1993, pp. 551-554