ACNP - Italian Periodicals Catalogue

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Results: 1-11 |

Results: 11

TEMPERATURE-DEPENDENCE OF ENERGY-GAP OF AMORPHOUS THIN-FILMS OF ZN3P2

Authors: BRYJA L JEZIERSKI K CIORGA M BOHDZIEWICZ A MISIEWICZ J

Citation: L. Bryja et al., TEMPERATURE-DEPENDENCE OF ENERGY-GAP OF AMORPHOUS THIN-FILMS OF ZN3P2, Vacuum, 50(1-2), 1998, pp. 5-7

POLYCRYSTALLISATION OF AMORPHOUS THIN-FILMS OF ZN3P2

Authors: BRYJA L CIORGA M JEZIERSKI K BOHDZIEWICZ A MISIEWICZ J

Citation: L. Bryja et al., POLYCRYSTALLISATION OF AMORPHOUS THIN-FILMS OF ZN3P2, Vacuum, 50(1-2), 1998, pp. 97-98

SURFACE AND INTERFACE OF GAAS SL-GAAS STRUCTURES INVESTIGATED BY PHOTOREFLECTANCE SPECTROSCOPY/

Authors: JEZIERSKI K SITAREK P MISIEWICZ J PANEK M SCIANA B KORBUTOWICZ R TLACZALA M

Citation: K. Jezierski et al., SURFACE AND INTERFACE OF GAAS SL-GAAS STRUCTURES INVESTIGATED BY PHOTOREFLECTANCE SPECTROSCOPY/, Vacuum, 48(3-4), 1997, pp. 277-282

PHOTOREFLECTANCE CHARACTERIZATION OF GAAS AND GAAS GAALAS STRUCTURES GROWN BY MOCVD/

Authors: MISIEWICZ J JEZIERSKI K SITAREK P MARKIEWICZ P KORBUTOWICZ R PANEK M SCIANA B TLACZALA M

Citation: J. Misiewicz et al., PHOTOREFLECTANCE CHARACTERIZATION OF GAAS AND GAAS GAALAS STRUCTURES GROWN BY MOCVD/, Advanced materials for optics and electronics, 5(6), 1995, pp. 321-327

INTERFACE AND SURFACE SUBSIGNALS IN PHOTOREFLECTANCE SPECTRA FOR GAASSI-GAAS STRUCTURES/

Authors: JEZIERSKI K SITAREK P MISIEWICZ J PANEK M SCIANA B KORBUTOWICZ R TLACZALA M

Citation: K. Jezierski et al., INTERFACE AND SURFACE SUBSIGNALS IN PHOTOREFLECTANCE SPECTRA FOR GAASSI-GAAS STRUCTURES/, Acta Physica Polonica. A, 88(4), 1995, pp. 751-754

INTERFACE AND SURFACE PHOTOREFLECTANCE SPECTRA FOR GAAS SI-GAAS STRUCTURES/

Authors: JEZIERSKI K MISIEWICZ J MARKIEWICZ P PANEK M SCIANA B TLACZALA M KORBUTOWICZ R

Citation: K. Jezierski et al., INTERFACE AND SURFACE PHOTOREFLECTANCE SPECTRA FOR GAAS SI-GAAS STRUCTURES/, Physica status solidi. a, Applied research, 147(2), 1995, pp. 467-475

APPLICATION OF KRAMERS-KRONIG ANALYSIS TO THE PHOTOREFLECTANCE SPECTRA OF HEAVILY-DOPED GAAS SI-GAAS STRUCTURES/

Authors: JEZIERSKI K MARKIEWICZ P MISIEWICZ J PANEK M SCIANA B KORBUTOWICZ R TLACZALA M

Citation: K. Jezierski et al., APPLICATION OF KRAMERS-KRONIG ANALYSIS TO THE PHOTOREFLECTANCE SPECTRA OF HEAVILY-DOPED GAAS SI-GAAS STRUCTURES/, Journal of applied physics, 77(8), 1995, pp. 4139-4141

A CLASSICAL OSCILLATORS MODEL FOR INFRARED REFLECTANCE SPECTRA OF ZN3P2

Authors: MISIEWICZ J LEMIEC A JEZIERSKI K WROBEL JM CLAYMAN BP

Citation: J. Misiewicz et al., A CLASSICAL OSCILLATORS MODEL FOR INFRARED REFLECTANCE SPECTRA OF ZN3P2, Infrared physics & technology, 35(6), 1994, pp. 775-779

SEMICONDUCTOR SURFACE-LAYER ANALYSIS BASED ON REFLECTOMETRY

Authors: JEZIERSKI K MISIEWICZ J GUMIENNY Z HEIMAN D

Citation: K. Jezierski et al., SEMICONDUCTOR SURFACE-LAYER ANALYSIS BASED ON REFLECTOMETRY, Surface and interface analysis, 20(8), 1993, pp. 651-654

OPTICAL-PROPERTIES OF ZN3P2 THIN-FILMS

Authors: BRYJA L JEZIERSKI K MISIEWICZ J

Citation: L. Bryja et al., OPTICAL-PROPERTIES OF ZN3P2 THIN-FILMS, Thin solid films, 229(1), 1993, pp. 11-13

INTERBAND-TRANSITIONS IN ZN3AS2

Authors: MISIEWICZ J WROBEL JM JEZIERSKI K

Citation: J. Misiewicz et al., INTERBAND-TRANSITIONS IN ZN3AS2, Solid state communications, 86(8), 1993, pp. 509-511

Risultati: 1-11 |