Authors: ANIEL F JINDELORME Y CROZAT P DELUSTRAC A ADDE R VANHOVE M DERAEDT W VANROSSUM M JIN Y LAUNOIS H

Citation: F. Aniel et al., GATE LENGTH ELECTRIC PARAMETER DEPENDENCES OF ULTRA-SUBMICROMETER DELTA-DOPED PSEUDOMORPHIC HEMTS, Electronics Letters, 29(17), 1993, pp. 1570-1571