Authors:
Jedrecy, N
Gallini, S
Sauvage-Simkin, M
Pinchaux, R
Citation: N. Jedrecy et al., Copper growth on the O-terminated ZnO(000(1)over-bar) surface: Structure and morphology - art. no. 085424, PHYS REV B, 6408(8), 2001, pp. 5424
Citation: N. Jedrecy et al., The hexagonal polar ZnO(0001)-(1 x 1) surfaces: structural features as stemming from X-ray diffraction, APPL SURF S, 162, 2000, pp. 69-73
Citation: N. Jedrecy, Coupling between spatial and angular variables in surface X-ray diffraction: effects on the line shapes and integrated intensities, J APPL CRYS, 33, 2000, pp. 1365-1375
Authors:
Jedrecy, N
Gavioli, L
Mariani, C
Betti, MG
Croset, B
de Beauvais, C
Citation: N. Jedrecy et al., Diffraction analysis of a disordered surface, modelled on a probability distribution of reconstructed blocks: Bi/Si(001)-(2xn), n = 6.45, J PHYS-COND, 11(8), 1999, pp. 1935-1951
Authors:
Jedrecy, N
Gavioli, L
Mariani, C
Corradini, V
Betti, MG
Croset, B
de Beauvais, C
Citation: N. Jedrecy et al., Structure and missing-dimer probability distribution of the (2 x n) Bi-induced Si(001) surface, SURF SCI, 435, 1999, pp. 367-372
Authors:
Giannini, C
Carlino, E
Sciacovelli, P
Tapfer, L
Sauvage-Simkin, M
Garreau, Y
Jedrecy, N
Veron, MB
Pinchaux, R
Citation: C. Giannini et al., Influence of the interface layer on the strain relaxation of ZnSe epitaxial layers grown by MBE on (001)GaAs, J PHYS D, 32(10A), 1999, pp. A51-A55