Citation: Zh. Jin, Comparison study of metal induced lateral crystallized and solid-phase crystallized polycrystalline silicon thin film transistors with different channel thickness, JPN J A P 1, 40(11), 2001, pp. 6325-6326
Citation: Ft. Xu et al., Superheating and melting behaviors of Ag clusters with Ni coating studied by molecular dynamics and experiments, SCI CHINA E, 44(4), 2001, pp. 432-440
Authors:
Hayashi, S
Kano, E
Tsuji, K
Furukawa-Furuya, M
Yoshikawa, S
Hatashita, M
Matsumoto, H
Jin, ZH
Ohtsubo, T
Kitai, R
Citation: S. Hayashi et al., Modification of thermosensitivity and chemosensitivity induced by combinedtreatments with hyperthermia and adriamycin, INT J MOL M, 8(4), 2001, pp. 417-422
Citation: Jl. Chen et al., Involvement of transcriptional enhancers in the regulation of developmental expression of yellow gene, SCI CHINA C, 44(2), 2001, pp. 170-177
Citation: Xc. Li et al., Application of neural network in precision prediction of hat-section profiles in rotary draw bending, J MAT SCI T, 17(1), 2001, pp. 137-138
Citation: Qc. Fan et al., Dissolution-precipitation mechanism of self-propagating high-temperature synthesis of mononickel aluminide, INTERMETALL, 9(7), 2001, pp. 609-619
Citation: Gh. Paulino et Zh. Jin, A crack in a viscoelastic functionally graded material layer embedded between two dissimilar homogeneous viscoelastic layers - antiplane shear analysis, INT J FRACT, 111(3), 2001, pp. 283-303
Citation: Zh. Jin et Gh. Paulino, Transient thermal stress analysis of an edge crack in a functionally graded material, INT J FRACT, 107(1), 2001, pp. 73-98
Citation: Zh. Jin et Gh. Paulino, Transient thermal stress analysis of an edge crack in a functionally graded material, INT J FRACT, 107(1), 2001, pp. 73-98
Citation: Xh. Xu et al., (ClAlNH)(n) cluster formation in the gas phase for the chemical vapor deposition of AlN thin films, J MOL ST-TH, 542, 2001, pp. 239-246
Citation: Sd. Li et al., Structural and electronic properties of semiconductor binary microclustersA(m)B(n) (A,B = Si,Ge,C): A B3LYP-DFT study - art. no. 195312, PHYS REV B, 6419(19), 2001, pp. 5312
Citation: Xh. Xu et al., Morphological properties of AIN piezoelectric thin films deposited by DC reactive magnetron sputtering, THIN SOL FI, 388(1-2), 2001, pp. 62-67
Citation: Zh. Jin et Jj. Simpson, Anisotropic reflectance of snow observed from space over the arctic and its effect on solar energy balance, REMOT SEN E, 75(1), 2001, pp. 63-75
Citation: Qc. Fan et al., Dual-solution-precipitation mechanism of combustion synthesis of TiC-Fe cermet with fine Ti powder, J MATER SCI, 36(23), 2001, pp. 5559-5563
Citation: Sd. Li et al., Ionization potentials, electron affinities, and vibrational frequencies ofGe-n (n=5-10) neutrals and charged ions from density functional theory, J CHEM PHYS, 115(20), 2001, pp. 9255-9259