Authors: Jinschek, J Kaiser, U Richter, W

Citation: J. Jinschek et al., Different void shapes in Si at the SiC thin film/Si(111) substrate interface, J ELEC MICR, 50(1), 2001, pp. 3-8

Authors: Lebedev, V Jinschek, J Krausslich, J Kaiser, U Schroter, B Richter, W

Citation: V. Lebedev et al., Hexagonal AlN films grown on nominal and off-axis Si(001) substrates, J CRYST GR, 230(3-4), 2001, pp. 426-431

Authors: Lebedev, V Jinschek, J Kaiser, U Schroter, B Richter, W Krausslich, J

Citation: V. Lebedev et al., Epitaxial relationship in the AlN/Si(001) heterosystem, APPL PHYS L, 76(15), 2000, pp. 2029-2031

Authors: Adamik, M Safran, G Barna, PB Tomov, I Kaiser, U Laux, S Jinschek, J Richter, W

Citation: M. Adamik et al., Structure evolution of NdF3 optical thin films, PHYS ST S-A, 175(2), 1999, pp. 637-649

Authors: Kaiser, U Khodos, II Jinschek, J Richter, W

Citation: U. Kaiser et al., A TEM study of local non-uniformities in epitaxial 2H-AlN films on Si(111)substrate, J ELEC MICR, 48(5), 1999, pp. 545-554