Authors:
Jourdan, C
Gastaldi, J
Baronnet, A
Belkahla, S
Guenin, G
Citation: C. Jourdan et al., In situ study by synchrotron X-ray diffraction of the motion of basal stacking faults during the reverse-phase transformation of a Cu-Zn-Al single crystal, MAT SCI E A, 266(1-2), 1999, pp. 191-197