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Citation: L. Dobaczewski et al., SINGLE TEMPERATURE SCAN DETERMINATION OF DEFECT PARAMETERS IN DLTS EXPERIMENT, Acta Physica Polonica. A, 92(4), 1997, pp. 724-726

Authors: DAGYS M KANCLERIS Z ORSEVSKI V SIMNISKIS R

Citation: M. Dagys et al., HIGH-POWER MICROWAVE PULSE MEASUREMENT USING RESISTIVE SENSORS, IEEE transactions on instrumentation and measurement, 46(2), 1997, pp. 499-502

Authors: DAGYS M KANCLERIS Z ORSEVSKIJ V SIMNISKIS R BACKSTROM M THIBBLIN U WAHLGREN B

Citation: M. Dagys et al., MEASUREMENT OF HIGH PULSED MICROWAVE-POWER IN FREE-SPACE, IEEE transactions on microwave theory and techniques, 43(6), 1995, pp. 1379-1380

Authors: DAGYS M KANCLERIS Z ORSEVSKIS V SIMNISKIS R

Citation: M. Dagys et al., RESISTIVE SENSOR FOR HIGH-POWER SHORT-PULSE MICROWAVE MEASUREMENT IN WAVE-GUIDES, Electronics Letters, 31(16), 1995, pp. 1355-1357

Authors: KANCLERIS Z WILLANDER M

Citation: Z. Kancleris et M. Willander, THE LOWEST APPROXIMATION FOR INELASTIC ACOUSTIC-PHONON SCATTERING CONSIDERATION IN A MONTE-CARLO PROCEDURE, Physica status solidi. b, Basic research, 180(1), 1993, pp. 207-212

Authors: DEDULEWICH S KANCLERIS Z MATULIS A POZHELA Y

Citation: S. Dedulewich et al., ELECTRON ELECTRON-SCATTERING IN HOT-ELECTRONS, Semiconductor science and technology, 7(3B), 1992, pp. 322-323