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Results:
1-16
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Results: 16
Authors:
LESCH N
KARDUCK P
CREMER R
VONRICHTHOFEN A
Citation: N. Lesch et al., INVESTIGATION OF THE ELECTRON-BEAM-INDUCED TRANSFORMATION OF CU-3 N-FILMS, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 604-607
Authors:
KARDUCK P
Citation: P. Karduck, QUANTITATIVE NEAR-SURFACE MICROANALYSIS AND DEPTH PROFILING BY EPMA, Mikrochimica acta (1966), 1998, pp. 109-123
Authors:
RICHTER S
LESCH N
KARDUCK P
Citation: S. Richter et al., EPMA SPUTTER DEPTH PROFILING, PART-I - THEORY AND EVALUATION, Mikrochimica acta (1966), 1998, pp. 125-131
Authors:
LESCH N
RICHTER S
KARDUCK P
Citation: N. Lesch et al., EPMA SPUTTER DEPTH PROFILING, PART-II - EXPERIMENT, Mikrochimica acta (1966), 1998, pp. 133-139
Authors:
ESSER HG
KARDUCK P
RUBEL M
ALMQVIST N
GROBUSCH L
VONSEGGERN J
WESCHENFELDER F
WIENHOLD P
Citation: Hg. Esser et al., COMPARISON OF DIFFERENT METHODS TO CHARACTERIZE THIN A-SI-H FILMS, Mikrochimica acta (1966), 1998, pp. 163-170
Authors:
HU W
KARDUCK P
GOTTSTEIN G
Citation: W. Hu et al., DIFFUSION OF NI INTO AL2O3-FIBERS DURING HOT-PRESSING OF AL2O3 NI3AL LONG-FIBER COMPOSITES/, Acta materialia, 45(11), 1997, pp. 4535-4545
Authors:
SURIG C
BONNENBERG D
HEMPEL KA
KARDUCK P
KLAAR HJ
SAUER C
Citation: C. Surig et al., EFFECTS OF VARIATIONS IN STOICHIOMETRY ON M-TYPE HEXAFERRITES, Journal de physique. IV, 7(C1), 1997, pp. 315-316
Authors:
SHEMET V
KARDUCK P
HOVEN H
GRUSHKO B
FISCHER W
QUADAKKERS WJ
Citation: V. Shemet et al., SYNTHESIS OF THE CUBIC Z-PHASE IN THE TI-AL-O SYSTEM BY A POWDER METALLURGICAL METHOD, Intermetallics, 5(4), 1997, pp. 271-280
Authors:
KARDUCK P
WIRTH T
PRIES H
Citation: P. Karduck et al., CHARACTERIZATION OF INTERMEDIATE LAYERS IN HOT-DIP ZINC COATED STEELS(VOL 358, PG 135, 1997), Fresenius' journal of analytical chemistry, 359(6), 1997, pp. 521-521
Authors:
KARDUCK P
WIRTH T
PRIES H
Citation: P. Karduck et al., CHARACTERIZATION OF INTERMEDIATE LAYERS IN HOT-DIP ZINC COATED STEELS, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 135-140
Authors:
WIENHOLD P
WESCHENFELDER F
VONSEGGERN J
EMMOTH B
ESSER HG
KARDUCK P
WINTER J
Citation: P. Wienhold et al., TIME-RESOLVED OBSERVATION OF THE EROSION OF BORON-CONTAINING PROTECTIVE COATINGS ON WALL ELEMENTS OF TEXTOR-94 BY MEANS OF COLORIMETRY, Journal of nuclear materials, 241, 1997, pp. 804-809
Authors:
KARDUCK P
VONRICHTHOFEN A
Citation: P. Karduck et A. Vonrichthofen, EPMA SPUTTER DEPTH PROFILING - A NEW TECHNIQUE FOR QUANTITATIVE IN-DEPTH ANALYSIS OF LAYERED STRUCTURES, Microscopy microanalysis microstructures, 6(4), 1995, pp. 421-432
Authors:
AMMANN N
KARDUCK P
Citation: N. Ammann et P. Karduck, QUANTITATIVE DEPTH PROFILE ANALYSIS BY EPMA COMBINED WITH MONTE-CARLOSIMULATION, Surface and interface analysis, 22(1-12), 1994, pp. 54-59
Authors:
AMMANN N
GLEITSMANN G
HEUKEN M
HEIME K
KARDUCK P
Citation: N. Ammann et al., INVESTIGATION OF IMPLANTED GALLIUM DEPTH DISTRIBUTIONS IN ZNSXSE1-X BY EPMA, Mikrochimica acta, 114, 1994, pp. 165-173
Authors:
VONRICHTHOFEN A
MATSUO M
KARDUCK P
AMMANN N
Citation: A. Vonrichthofen et al., COMBINED EPMA AND AES DEPTH PROFILING OF A MULTILAYER TI-AL-O-N COATING, Mikrochimica acta, 114, 1994, pp. 511-523
Authors:
GLEITSMANN G
AMMANN N
HERMANS J
SCHNEIDER A
GEURTS J
KARDUCK P
HEUKEN M
Citation: G. Gleitsmann et al., COMPARISON BETWEEN GALLIUM-IMPLANTED LAYERS OF ZNSE AND ZNSXSE1-X BY OPTICAL, ELECTRICAL AND ELECTRON-BEAM CHARACTERIZATION METHODS, Journal of crystal growth, 138(1-4), 1994, pp. 324-330
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