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Authors: TAKEDA E IKUZAKI K KATTO H OHJI Y HINODE K HAMADA A SAKUTA T FUNABIKI T SASAKI T

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Authors: TAKEDA E IKUZAKI K KATTO H OHJI Y HINODE K HAMADA A SAKUTA T FUNABIKI T SASAKI T

Citation: E. Takeda et al., VLSI RELIABILITY CHALLENGES - FROM DEVICE PHYSICS TO WAFER-SCALE SYSTEMS, Proceedings of the IEEE, 81(5), 1993, pp. 653-674