Authors: ACKERMAN DA ZHANG LM KETELSEN LJP JOHNSON JE

Citation: Da. Ackerman et al., CHARACTERIZING RESIDUAL REFLECTIONS WITHIN SEMICONDUCTOR-LASERS, INTEGRATED SOURCES, AND COUPLING OPTICS, IEEE journal of quantum electronics, 34(7), 1998, pp. 1224-1230

Authors: KETELSEN LJP KAZARINOV RF

Citation: Ljp. Ketelsen et Rf. Kazarinov, CARRIER LOSS IN INGAASP-INP LASERS GROWN BY HYDRIDE CVD, IEEE journal of quantum electronics, 31(5), 1995, pp. 811-813

Authors: KETELSEN LJP

Citation: Ljp. Ketelsen, SIMPLE TECHNIQUE FOR MEASURING CAVITY LOSS IN SEMICONDUCTOR-LASERS, Electronics Letters, 30(17), 1994, pp. 1422-1424