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Results: 1-18 |
Results: 18
WAVELENGTH SWITCHING AND ROUTING USING ABSORPTION AND RESONANCE
Authors: LITTLE BE HAUS HA FORESI JS KIMERLING LC IPPEN EP RIPIN DJ
Citation: Be. Little et al., WAVELENGTH SWITCHING AND ROUTING USING ABSORPTION AND RESONANCE, IEEE photonics technology letters, 10(6), 1998, pp. 816-818
ULTRA-COMPACT SI-SIO2 MICRORING RESONATOR OPTICAL CHANNEL DROPPING FILTERS
Authors: LITTLE BE FORESI JS STEINMEYER G THOEN ER CHU ST HAUS HA IPPEN EP KIMERLING LC GREENE W
Citation: Be. Little et al., ULTRA-COMPACT SI-SIO2 MICRORING RESONATOR OPTICAL CHANNEL DROPPING FILTERS, IEEE photonics technology letters, 10(4), 1998, pp. 549-551
SILICON-BASED MICROPHOTONICS AND INTEGRATED OPTOELECTRONICS
Authors: FITZGERALD EA KIMERLING LC
Citation: Ea. Fitzgerald et Lc. Kimerling, SILICON-BASED MICROPHOTONICS AND INTEGRATED OPTOELECTRONICS, MRS bulletin, 23(4), 1998, pp. 39-47
DETECTION OF METALLIC CONTAMINANTS ON SILICON BY SURFACE SENSITIVE MINORITY-CARRIER LIFETIME MEASUREMENTS
Authors: NORGA GJ PLATERO M BLACK KA REDDY AJ MICHEL J KIMERLING LC
Citation: Gj. Norga et al., DETECTION OF METALLIC CONTAMINANTS ON SILICON BY SURFACE SENSITIVE MINORITY-CARRIER LIFETIME MEASUREMENTS, Journal of the Electrochemical Society, 145(7), 1998, pp. 2602-2607
PHOTONIC-BANDGAP MICROCAVITIES IN OPTICAL WAVE-GUIDES
Authors: FORESI JS VILLENEUVE PR FERRERA J THOEN ER STEINMEYER G FAN S JOANNOPOULOS JD KIMERLING LC SMITH HI IPPEN EP
Citation: Js. Foresi et al., PHOTONIC-BANDGAP MICROCAVITIES IN OPTICAL WAVE-GUIDES, Nature, 390(6656), 1997, pp. 143-145
MECHANISM OF COPPER DEPOSITION ON SILICON FROM DILUTE HYDROFLUORIC-ACID SOLUTION
Authors: NORGA GJ PLATERO M BLACK KA REDDY AJ MICHEL J KIMERLING LC
Citation: Gj. Norga et al., MECHANISM OF COPPER DEPOSITION ON SILICON FROM DILUTE HYDROFLUORIC-ACID SOLUTION, Journal of the Electrochemical Society, 144(8), 1997, pp. 2801-2810
ELECTROLUMINESCENCE OF ERBIUM-DOPED SILICON
Authors: PALM J GAN F ZHENG B MICHEL J KIMERLING LC
Citation: J. Palm et al., ELECTROLUMINESCENCE OF ERBIUM-DOPED SILICON, Physical review. B, Condensed matter, 54(24), 1996, pp. 17603-17615
LOW-LOSS POLYCRYSTALLINE SILICON WAVE-GUIDES FOR SILICON PHOTONICS
Authors: AGARWAL AM LIAO L FORESI JS BLACK MR DUAN XM KIMERLING LC
Citation: Am. Agarwal et al., LOW-LOSS POLYCRYSTALLINE SILICON WAVE-GUIDES FOR SILICON PHOTONICS, Journal of applied physics, 80(11), 1996, pp. 6120-6123
LOSSES IN POLYCRYSTALLINE SILICON WAVE-GUIDES
Authors: FORESI JS BLACK MR AGARWAL AM KIMERLING LC
Citation: Js. Foresi et al., LOSSES IN POLYCRYSTALLINE SILICON WAVE-GUIDES, Applied physics letters, 68(15), 1996, pp. 2052-2054
EXPERTS CONSIDER THE FUTURE OF ELECTRONIC MATERIALS
Authors: FREAR D HIRTH JP HOWARD JK KIMERLING LC WESSELS B
Citation: D. Frear et al., EXPERTS CONSIDER THE FUTURE OF ELECTRONIC MATERIALS, JOM, 47(3), 1995, pp. 64-65
THE JOURNAL TALKS WITH 1994 TMS PRESIDENT KIMERLING,LIONEL,C
Authors: KIMERLING LC
Citation: Lc. Kimerling, THE JOURNAL TALKS WITH 1994 TMS PRESIDENT KIMERLING,LIONEL,C, JOM, 47(2), 1995, pp. 74-75
METAL REMOVAL FROM SILICON SURFACES IN WET CHEMICAL-SYSTEMS
Authors: NORGA GJ KIMERLING LC
Citation: Gj. Norga et Lc. Kimerling, METAL REMOVAL FROM SILICON SURFACES IN WET CHEMICAL-SYSTEMS, Journal of electronic materials, 24(4), 1995, pp. 397-404
SIMULATION AND IN-SITU MONITORING OF METALLIC CONTAMINATION AND SURFACE ROUGHENING IN WET WAFER CLEANING SOLUTIONS
Authors: NORGA GJ BLACK KA MSAAD H MICHEL J KIMERLING LC
Citation: Gj. Norga et al., SIMULATION AND IN-SITU MONITORING OF METALLIC CONTAMINATION AND SURFACE ROUGHENING IN WET WAFER CLEANING SOLUTIONS, Materials science and technology, 11(1), 1995, pp. 90-93
MONITORING AND OPTIMIZATION OF SILICON SURFACE QUALITY
Authors: MSAAD H MICHEL J REDDY A KIMERLING LC
Citation: H. Msaad et al., MONITORING AND OPTIMIZATION OF SILICON SURFACE QUALITY, Journal of the Electrochemical Society, 142(8), 1995, pp. 2833-2835
ELECTRONIC PASSIVATION OF SILICON SURFACES BY HALOGENS
Authors: MSAAD H MICHEL J LAPPE JJ KIMERLING LC
Citation: H. Msaad et al., ELECTRONIC PASSIVATION OF SILICON SURFACES BY HALOGENS, Journal of electronic materials, 23(5), 1994, pp. 487-491
ROOM-TEMPERATURE SHARP LINE ELECTROLUMINESCENCE AT LAMBDA=1.54-MU-M FROM AN ERBIUM-DOPED, SILICON LIGHT-EMITTING DIODE
Authors: ZHENG B MICHEL J REN FYG KIMERLING LC JACOBSON DC POATE JM
Citation: B. Zheng et al., ROOM-TEMPERATURE SHARP LINE ELECTROLUMINESCENCE AT LAMBDA=1.54-MU-M FROM AN ERBIUM-DOPED, SILICON LIGHT-EMITTING DIODE, Applied physics letters, 64(21), 1994, pp. 2842-2844
THE MECHANISMS OF ELECTRONIC EXCITATION OF RARE-EARTH IMPURITIES IN SEMICONDUCTORS
Authors: YASSIEVICH IN KIMERLING LC
Citation: In. Yassievich et Lc. Kimerling, THE MECHANISMS OF ELECTRONIC EXCITATION OF RARE-EARTH IMPURITIES IN SEMICONDUCTORS, Semiconductor science and technology, 8(5), 1993, pp. 718-727
DEFECT ENGINEERING
Authors: KIMERLING LC
Citation: Lc. Kimerling, DEFECT ENGINEERING, MRS bulletin, 16(12), 1991, pp. 42-47
Risultati: 1-18 |