Authors:
VATERLAUS A
FEENSTRA RM
KIRCHNER PD
WOODALL JM
PETTIT GD
Citation: A. Vaterlaus et al., CROSS-SECTIONAL SCANNING-TUNNELING-MICROSCOPY OF EPITAXIAL GAAS STRUCTURES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(4), 1993, pp. 1502-1508
Citation: Jm. Woodall et al., THE CONTINUING DRAMA OF THE SEMICONDUCTOR INTERFACE, Philosophical transactions-Royal Society of London. Physical sciences and engineering, 344(1673), 1993, pp. 521-532
Citation: Md. Pashley et al., DIFFERENT FERMI-LEVEL PINNING BEHAVIOR ON N-TYPE AND P-TYPE GAAS(001), Physical review. B, Condensed matter, 48(7), 1993, pp. 4612-4615
Authors:
KIRCHNER PD
VATERLAUS A
FEENSTRA RM
LIN CL
PETTIT GD
WOODALL JM
Citation: Pd. Kirchner et al., SOLUBILITY-LIMIT ACTIVATION OF SI DOPING AT MBE GAAS PN JUNCTIONS OBSERVED BY CROSS-SECTIONAL SCANNING-TUNNELING-MICROSCOPY, Journal of crystal growth, 127(1-4), 1993, pp. 1030-1031
Authors:
CHIN TP
CHANG JCP
KAVANAGH KL
TU CW
KIRCHNER PD
WOODALL JM
Citation: Tp. Chin et al., GAS-SOURCE MOLECULAR-BEAM EPITAXIAL-GROWTH, CHARACTERIZATION, AND LIGHT-EMITTING DIODE APPLICATION OF IN(X)GA(1-X)P ON GAP(100), Applied physics letters, 62(19), 1993, pp. 2369-2371