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DOWNEY SW
EMERSON AB
GEORGIOU GE
BEVK J
KISTLER RC
MORIYA N
JACOBSON DC
WISE ML
Citation: Sw. Downey et al., DEPTH PROFILING OF DOPANTS IN THIN GATE OXIDES IN COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR STRUCTURES BY RESONANCE IONIZATION MASS-SPECTROMETRY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(2), 1995, pp. 167-173
Authors:
ADAR R
HENRY CH
DRAGONE C
KISTLER RC
MILBRODT MA
Citation: R. Adar et al., BROAD-BAND ARRAY MULTIPLEXERS MADE WITH SILICA WAVE-GUIDES ON SILICON, Journal of lightwave technology, 11(2), 1993, pp. 212-219
Authors:
MANCHANDA L
WEBER GR
KIM YO
FELDMAN LC
MORYIA N
WEIR BE
KISTLER RC
GREEN ML
BRASEN D
Citation: L. Manchanda et al., A NEW METHOD TO FABRICATE THIN OXYNITRIDE OXIDE GATE DIELECTRIC FOR DEEP-SUBMICRON DEVICES, Microelectronic engineering, 22(1-4), 1993, pp. 69-72