Authors:
OZER M
PARASKEVOPOULOS KM
ANAGNOSTOPOULOS AN
KOKKOU S
POLYCHRONIADIS EK
Citation: M. Ozer et al., SINGLE-CRYSTAL GROWTH AND CHARACTERIZATION OF NARROW-GAP (TLBISE2)(1-X)-(TLBIS2) MIXED-CRYSTALS, Semiconductor science and technology, 13(1), 1998, pp. 86-92
Authors:
MCFARLANE W
AKRIVOS PD
ASLANIDIS P
KARAGIANNIDIS P
HATZISYMEON C
NUMAN M
KOKKOU S
Citation: W. Mcfarlane et al., SILVER(I) COMPLEXES WITH HETEROCYCLIC THIONES AND TERTIARY PHOSPHINESAS LIGANDS - PART 3 - SOLUTION BEHAVIOR OF MONONUCLEAR COMPLEXES OF SILVER(I) NITRATE - THE CRYSTAL-STRUCTURE OF ENYLPHOSPHINO)BIS(BENZOXAZOLINE-2-THIONE)SILVER(I) NITRATE, Inorganica Chimica Acta, 281(2), 1998, pp. 121-125
Authors:
TASSIS DH
DIMITRIADIS CA
BOULTADAKIS S
ARVANITIDIS J
VES S
KOKKOU S
LOGOTHETIDIS S
VALASSIADES O
POULOPOULOS P
FLEVARIS NK
Citation: Dh. Tassis et al., INFLUENCE OF CONVENTIONAL FURNACE AND RAPID THERMAL ANNEALING ON THE QUALITY OF POLYCRYSTALLINE BETA-FESI2 THIN-FILMS GROWN FROM VAPOR-DEPOSITED FE SI MULTILAYERS/, Thin solid films, 310(1-2), 1997, pp. 115-122
Citation: S. Logothetidis et al., OPTIMIZATION OF TIN THIN-FILM GROWTH WITH IN-SITU MONITORING - THE EFFECT OF BIAS VOLTAGE AND NITROGEN FLOW-RATE, Surface & coatings technology, 80(1-2), 1996, pp. 66-71
Authors:
HATZISYMEON K
ANAGNOSTOPOULOS AN
KOKKOU S
RENTZEPERIS P
Citation: K. Hatzisymeon et al., ENERGY-GAP VARIATION OF THE (THALLIUM SELENIDE)(X)-(INDIUM SELENIDE)(1-X) MIXED-CRYSTALS (X=0.1,0.2, - ,0.9,1.0), Materials research bulletin, 31(11), 1996, pp. 1383-1390
Authors:
ADJAOTTOR AA
MELETIS EI
LOGOTHETIDIS S
ALEXANDROU I
KOKKOU S
Citation: Aa. Adjaottor et al., EFFECT OF SUBSTRATE BIAS ON SPUTTER-DEPOSITED TICX, TINY AND TICXNY THIN-FILMS, Surface & coatings technology, 76(1-3), 1995, pp. 142-148