Authors:
HUGHES OH
KORAKAKIS D
CHENG TS
BLANT AV
JEFFS NJ
FOXON CT
Citation: Oh. Hughes et al., REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION STUDIES OF WURTZITE GAN GROWN BY MOLECULAR-BEAM EPITAXY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 2237-2241
Authors:
SMITH KE
DUDA LC
STAGARESCU CB
DOWNES J
KORAKAKIS D
SINGH R
MOUSTAKAS TD
GUO JH
NORDGREN J
Citation: Ke. Smith et al., SOFT-X-RAY EMISSION STUDIES OF THE BULK ELECTRONIC-STRUCTURE OF ALN, GAN, AND AL0.5GA0.5N, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 2250-2253
Citation: D. Korakakis et al., X-RAY CHARACTERIZATION OF GAN ALGAN MULTIPLE-QUANTUM WELLS FOR ULTRAVIOLET-LASER DIODES/, Applied physics letters, 72(9), 1998, pp. 1004-1006