Citation: T. Kouno et al., EFFECT OF AL3TI INTERMETALLIC COMPOUND ON ELECTROMIGRATION LIFETIME OF AL-ALLOY INTERCONNECTIONS, Journal of applied physics, 84(2), 1998, pp. 742-750
Citation: T. Kouno et al., EFFECT OF TIN MICROSTRUCTURE ON DIFFUSION BARRIER PROPERTIES IN CU METALLIZATION, Journal of the Electrochemical Society, 145(6), 1998, pp. 2164-2167
Citation: T. Kouno et al., ANOMALOUS, BEHAVIOR OF RESISTANCE IN AL-ALLOY INTERCONNECTIONS STACKED WITH TI LAYERS DURING ELECTROMIGRATION TESTS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(5), 1997, pp. 1800-1804
Authors:
SAKAIZUMI T
SASANE I
KOUNO T
TAKEDA S
KUZE N
OHASHI O
IIJIMA K
Citation: T. Sakaizumi et al., MICROWAVE-SPECTRUM, MOLECULAR-STRUCTURE, AND AB-INITIO CALCULATION OF(E)-CHLOROACETALDEHYDE OXIME, Journal of molecular structure, 413, 1997, pp. 107-119
Citation: T. Inagaki et al., PHASE-STRUCTURE OF 4-FERMION THEORIES AT FINITE-TEMPERATURE AND CHEMICAL-POTENTIAL IN ARBITRARY DIMENSIONS, International journal of modern physics A, 10(15), 1995, pp. 2241-2268
Authors:
KOUNO T
EGASHIRA T
TAKAYAMA F
KUDO Y
YAMANAKA Y
Citation: T. Kouno et al., EFFECT OF METHYLPREDNISOLONE ON PLASMA-LIPID PEROXIDATION INDUCED BY LIPOPOLYSACCHARIDE, Japanese Journal of Pharmacology, 64(3), 1994, pp. 163-169