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Results:
1-18
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Results: 18
Authors:
SHARMA KK
KRISHNA H
SINGH B
Citation: Kk. Sharma et al., BAYES ESTIMATION OF THE MIXTURE OF HAZARD-RATE MODEL, Reliability engineering & systems safety, 55(1), 1997, pp. 9-13
Authors:
KRISHNA H
SHARMA KK
Citation: H. Krishna et Kk. Sharma, ON THE UNIFORMLY MINIMUM-VARIANCE UNBIASED ESTIMATOR OF AVAILABILITY WITH TYPE-I CENSORED-DATA, Microelectronics and reliability, 36(2), 1996, pp. 269-271
Authors:
KRISHNA H
LIN KY
KRISHNA B
Citation: H. Krishna et al., THE AICE-CRT AND DIGITAL SIGNAL-PROCESSING ALGORITHMS - THE COMPLEX CASE, Circuits, systems, and signal processing, 14(1), 1995, pp. 69-85
Authors:
SHARMA KK
KRISHNA H
Citation: Kk. Sharma et H. Krishna, NONPARAMETRIC INFERENCES ON SYSTEM AVAILABILITY WITH A REFERENCE OF K-OUT-OF-M SYSTEMS, Microelectronics and reliability, 35(2), 1995, pp. 289-293
Authors:
KRISHNA H
SHARMA KK
Citation: H. Krishna et Kk. Sharma, BAYES ESTIMATES OF POINTWISE AND INTERVAL AVAILABILITY WITH TYPE-I CENSORED SAMPLES, Microelectronics and reliability, 35(1), 1995, pp. 33-36
Authors:
SHARMA KK
KRISHNA H
Citation: Kk. Sharma et H. Krishna, NONPARAMETRIC DISTRIBUTION OF THE RELIABILITY FUNCTION FOR SOME BASICSYSTEM CONFIGURATIONS, Microelectronics and reliability, 35(1), 1995, pp. 37-39
Authors:
KRISHNA H
SHARMA KK
Citation: H. Krishna et Kk. Sharma, INFERENCES ON AVAILABILITY RATIO, Microelectronics and reliability, 35(1), 1995, pp. 105-108
Authors:
LIN KY
KRISHNA B
KRISHNA H
Citation: Ky. Lin et al., RINGS, FIELDS, THE CHINESE REMAINDER THEOREM AND AN EXTENSION .1. THEORY, IEEE transactions on circuits and systems. 2, Analog and digital signal processing, 41(10), 1994, pp. 641-655
Authors:
KRISHNA H
LIN KY
KRISHNA B
Citation: H. Krishna et al., RINGS, FIELDS AND CHINESE REMAINDER THEOREM AND AN EXTENSION .2. APPLICATIONS TO DIGITAL SIGNAL-PROCESSING, IEEE transactions on circuits and systems. 2, Analog and digital signal processing, 41(10), 1994, pp. 656-668
Authors:
SHARMA KK
KRISHNA H
Citation: Kk. Sharma et H. Krishna, BAYESIAN RELIABILITY-ANALYSIS OF A K-OUT-OF-M SYSTEM AND THE ESTIMATION OF SAMPLE-SIZE AND CENSORING TIME, Reliability engineering & systems safety, 44(1), 1994, pp. 11-15
Authors:
KRISHNA H
Citation: H. Krishna, A MATHEMATICAL FRAMEWORK FOR ALGORITHM-BASED FAULT-TOLERANT COMPUTINGOVER A RING OF INTEGERS, Circuits, systems, and signal processing, 13(5), 1994, pp. 625-653
Authors:
SHARMA KK
KRISHNA H
Citation: Kk. Sharma et H. Krishna, ON THE ESTIMATION OF SAMPLE-SIZE AND CENSORING TIME IN LIFE TESTING EXPERIMENTS, Microelectronics and reliability, 34(1), 1994, pp. 125-134
Authors:
SHARMA KK
KRISHNA H
Citation: Kk. Sharma et H. Krishna, TOLERANCE LIMITS FOR THE RELIABILITY OF A K-OUT-OF-M SYSTEM, Microelectronics and reliability, 34(1), 1994, pp. 179-181
Authors:
SHARMA KK
KRISHNA H
Citation: Kk. Sharma et H. Krishna, ASYMPTOTIC SAMPLING DISTRIBUTION OF INVERSE COEFFICIENT-OF-VARIATION AND ITS APPLICATIONS, IEEE transactions on reliability, 43(4), 1994, pp. 630-633
Authors:
SUN JD
KRISHNA H
Citation: Jd. Sun et H. Krishna, FAST ALGORITHMS FOR ERASURES AND ERROR-CORRECTION IN REDUNDANT RESIDUE NUMBER-SYSTEMS, Circuits, systems, and signal processing, 12(4), 1993, pp. 503-531
Authors:
KRISHNA H
WANG YB
Citation: H. Krishna et Yb. Wang, THE SPLIT LEVINSON ALGORITHM IS WEAKLY STABLE, SIAM journal on numerical analysis, 30(5), 1993, pp. 1498-1508
Authors:
SHARMA KK
KRISHNA H
Citation: Kk. Sharma et H. Krishna, RELIABILITY BOUNDS FOR SOME STATIC SYSTEM MODELS USING LIFETIME DATA ON THEIR COMPONENTS, Microelectronics and reliability, 33(8), 1993, pp. 1081-1083
Authors:
KRISHNA H
SUN JD
Citation: H. Krishna et Jd. Sun, ON THEORY AND FAST ALGORITHMS FOR ERROR-CORRECTION IN RESIDUE NUMBER SYSTEM PRODUCT CODES, I.E.E.E. transactions on computers, 42(7), 1993, pp. 840-853
Risultati:
1-18
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