BAYES ESTIMATES OF POINTWISE AND INTERVAL AVAILABILITY WITH TYPE-I CENSORED SAMPLES

Authors
KRISHNA H SHARMA KK
Citation
H. Krishna et Kk. Sharma, BAYES ESTIMATES OF POINTWISE AND INTERVAL AVAILABILITY WITH TYPE-I CENSORED SAMPLES, Microelectronics and reliability, 35(1), 1995, pp. 33-36
Citations number
7
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Microelectronics and reliability → ACNP
ISSN journal
00262714
Volume
35
Issue
1
Year of publication
1995
Pages
33 - 36
Database
ISI
SICI code
0026-2714(1995)35:1<33:BEOPAI>2.0.ZU;2-I
Abstract
Bayesian analysis combines the prior belief about the lifetime paramet ers with the experimental data. The present study develops Bayes estim ates for the pointwise and interval availability of a system with cons tant Failure and repair rates. Type I censored failure and repair info rmation has been used in the estimation.