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Results: 1
A HIGH-LEVEL APPROACH TO TEST-GENERATION
Authors:
NARAIN P SAAB DG KUNDA RP ABRAHAM JA
Citation:
P. Narain et al., A HIGH-LEVEL APPROACH TO TEST-GENERATION, IEEE transactions on circuits and systems. 1, Fundamental theory andapplications, 40(7), 1993, pp. 483-492
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