Citation: Sy. Kweon et al., INTRINSIC STRESS DEPENDENCE OF C-AXIS ORIENTATION RATIO IN PBTIO3 THIN-FILMS DEPOSITED BY REACTIVE SPUTTERING, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(1), 1997, pp. 57-61
Citation: Sk. Choi et al., SURFACE CHARACTERIZATION OF DIAMOND FILMS POLISHED BY THERMOMECHANICAL POLISHING METHOD, Thin solid films, 279(1-2), 1996, pp. 110-114
Citation: Sy. Kweon et Sk. Choi, PREDICTION OF RESIDUAL STRESS-INDUCED CRACKING BY FINITE-ELEMENT ANALYSIS, Scripta metallurgica et materialia, 32(3), 1995, pp. 359-364