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Results:
1-6
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Results: 6
Retargeting RSFQ cells to a submicron fabrication process
Authors:
Brock, DK Kadin, AM Kirichenko, AF Mukhanov, OA Sarwana, S Vivalda, JA Chen, W Lukens, JE
Citation:
Dk. Brock et al., Retargeting RSFQ cells to a submicron fabrication process, IEEE APPL S, 11(1), 2001, pp. 369-372
A superconductor high-resolution ADC
Authors:
Mukhanov, OA Semenov, VK Li, WQ Filippov, TV Gupta, D Kadin, AM Brock, DK Kirichenko, AF Polyakov, YA Vernik, IV
Citation:
Oa. Mukhanov et al., A superconductor high-resolution ADC, IEEE APPL S, 11(1), 2001, pp. 601-606
Can RSFQ logic circuits be scaled to deep submicron junctions?
Authors:
Kadin, AM Mancini, CA Feldman, MJ Brock, DK
Citation:
Am. Kadin et al., Can RSFQ logic circuits be scaled to deep submicron junctions?, IEEE APPL S, 11(1), 2001, pp. 1050-1055
A phenomenological model for high-frequency dynamics of double-barrier (SINIS) Josephson junctions
Authors:
Kadin, AM
Citation:
Am. Kadin, A phenomenological model for high-frequency dynamics of double-barrier (SINIS) Josephson junctions, SUPERCOND S, 14(5), 2001, pp. 276-284
Single-photon-counting hotspot detector with integrated RSFQ readout electronics
Authors:
Gupta, D Kadin, AM
Citation:
D. Gupta et Am. Kadin, Single-photon-counting hotspot detector with integrated RSFQ readout electronics, IEEE APPL S, 9(2), 1999, pp. 4487-4490
Modeling of the surface roughness of thin TiSi2 films at the point of rupture
Authors:
Amorsolo, AV Funkenbusch, PD Kadin, AM
Citation:
Av. Amorsolo et al., Modeling of the surface roughness of thin TiSi2 films at the point of rupture, MAT SCI E B, 57(3), 1999, pp. 186-196
Risultati:
1-6
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