Authors: Takeuchi, O Kageshima, M Sakama, H Kawazu, A

Citation: O. Takeuchi et al., Scanning tunneling microscopy study on c(6 x 2) structure of Ag/Si(001), JPN J A P 1, 40(6B), 2001, pp. 4414-4418

Authors: Kageshima, M Torii, Y Tano, Y Takeuchi, O Kawazu, A

Citation: M. Kageshima et al., Study of Au-induced reconstruction on Si(001) surface by scanning tunneling microscopy and low energy electron diffraction, SURF SCI, 472(1-2), 2001, pp. 51-58

Authors: Ptak, A Takeda, S Nakamura, C Miyake, J Kageshima, M Jarvis, SP Tokumoto, H

Citation: A. Ptak et al., Modified atomic force microscope applied to the measurement of elastic modulus for a single peptide molecule, J APPL PHYS, 90(6), 2001, pp. 3095-3099

Authors: Kageshima, M Lantz, MA Jarvis, SP Tokumoto, H Takeda, S Ptak, A Nakamura, C Miyake, J

Citation: M. Kageshima et al., Insight into conformational changes of a single alpha-helix peptide molecule through stiffness measurements, CHEM P LETT, 343(1-2), 2001, pp. 77-82

Authors: Takeda, S Ptak, A Nakamura, C Miyake, J Kageshima, M Jarvis, SP Tokumoto, H

Citation: S. Takeda et al., Measurement of the length of the alpha helical section of a peptide directly using atomic force microscopy, CHEM PHARM, 49(12), 2001, pp. 1512-1516

Authors: Kageshima, M Ogiso, H Nakano, S Lantz, MA Tokumoto, H

Citation: M. Kageshima et al., Atomic force microscopy cantilevers for sensitive lateral force detection, JPN J A P 1, 38(6B), 1999, pp. 3958-3961